ATLANTA SMTA EVENTS

Topic: What’s Creeping Around in Your Data Center? 

  The Effects of Air Impurities Casusing Corrosion/Failures on RoHos Compliant Electronic Assemblies, with examples.

Speaker: Christopher O. Muller

  Mr. Muller received his B.S. in Applied Biology with a minor in Chemistry from Georgia Tech and has done postgraduate work in Industrial Engineering at Southern Polytechnic State University.

Chris Muller is the Technical Director at Purafil, Inc. of Doraville, GA (USA), a manufacturer of gas-phase air filtration media, filters, equipment, and air monitoring instrumentation. He is responsible for all technical support services as well as various research and development functions. Prior to joining Purafil, he worked in the chemical processing, pharmaceutical manufacturing, and environmental industries in quality assurance / quality control.

He has written and spoken extensively on the subject of environmental air quality control and reactivity (corrosion) monitoring and counts over 60 papers and articles, more than 40 seminars, and 7 handbooks to his credit. He authored the chapter on airborne molecular contamination (AMC) in the "Semiconductor Manufacturing Handbook" published by McGraw-Hill (Hwaiyu Geng, Ed.). He has also written chapters on gas-phase air filtration for the National Air Filtration Association's (NAFA) Air Filtration Handbook and for Carrier Corporation's Applications Technical Development Program. He has consulted on the preparation of Dutch and Italian governmental standards for air quality and has worked with many groups in the U.S. and abroad to develop and implement environmental control strategies for airborne contaminants.

Mr. Muller is a member of the International Society of Automation (ISA) and co-chair the S71 committee on Environmental Conditions for Process Measurement and Control Systems, which first developed the use of reactivity monitoring for performing environmental assessments and classifications. He serves on the Yield Enhancement Technical Working Group and the Wafer Environment Contamination Control (WECC) subgroup for the International Technology Roadmap for Semiconductors (ITRS). He is a senior member of the Institute of Environmental Science and Technology (IEST) and is a member of working groups on cleanroom environments and design considerations for AMC filtration systems and contributes to their working group on gas-phase absorber cells. He chairs the American Society of Heating, Refrigerating and Air-Conditioning Engineer's (ASHRAE) Standard Project Committee 145P, which is developing industry standards for assessing the performance of media and equipment used in gas-phase air filtration systems.


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